onTAP Series 4000 Overview 
The onTAP Series 4000 software and hardware simplifies boundary scan testing and programming over the entire product lifecycle. It supports very reliable, simple and cost-effective design, development, production and support of your electronics manufacturing. onTAP supports your design in terms of the well-known IEEE 1149 rules. All tests are simply run via a USB cable via the respective JTAG port – regardless of whether BScan components, non-BScan capable ICs (DDR2, SRAM,..) or FLASH (In System Programming) have to be handled.
Flynn System has been delivering robust and powerful SW&HW solutions for more than 10 years. Thanks to the enormous customer base and our extensive JTAG expertise, professional test solutions, easy-to-use interfaces with graphical support, but also the need for technical support have emerged. ATEcare is your local contact in German-speaking countries, Italy and Eastern Europe.
Design for Testability (DFT) and JTAG rules
Optimized designs enable significant cost reduction and time to market.
More than 10 years of active JTAG testing and thousands of projects with the Boundary Scan SW onTAP form a know-how that has been logically and consistently implemented in the integration of DFT tools.
Save time and money. onTAP offers the most cost-effective entry into the Boundary Scan world on the market. But you don’t have to do without widely used tools such as DFT tools, automatic test creation, graphical error help guidelines, maximum error coverage, pin-based error detection and good support, even in the local language.
Test generation
The Boundary Scan SW onTAP contains all the necessary tools needed to create comprehensive, reliable and stable JTAG test solutions. This development environment includes more than 2 dozen CAD converters. With an integrated netlist merge tool and ProScan, a graphical debug environment, projects can be created in no time. With these tools you can create, start and adapt tests quickly and easily. This applies to simple single-chain components, multiple JTAG chains and merged netlists in a variety of configurations and this without limiting the number of nodes. The price-performance ratio is probably the best on the market at the moment.
Production test
All generated tests can be executed using the “Manufacturing Test Option”, or MTO for short. You can open and execute each test repeatedly. Saved test results can be used by the development team for optimization. This is a particularly useful tool when layout changes occur. The main objective of onTAP is to create ready-made test solutions and support flash programming. MTO programs are protected against accidental changes. All adjustments must be made in the onTAP development environment while ensuring data integrity.
Contract-based test development
With BSDL and CAD files as well as the data sheets for non-JTAG capable memory or FLASH components, Boundary Scan tests can also be created jointly via telephone support. If you encounter problems during commissioning, we will support you with our specialist knowledge, especially in the case of unexpected module or component influences.
Technical support
Flynn Systems is known for its active technical support, which often provides solutions within a day, and if possible within a few hours. You can also find support in the local language from local distribution partners. In order to be able to help quickly and effectively, we need the relevant data from you about the development work you have already done (project folder). ATEcare and the Flynn Systems support team will support you interactively during the creation process up to the “PASS” and in the shortest possible time.
Flexible and reusable models
Flexibility is key in most production environments, so the Series 4000 allows you to easily modify and adapt existing DTS models, each of which can then easily be used in other applications.
Flash programming
The onTAP Series 4000 will program its FLASH memory as quickly as possible using the new high-speed USB cable and the JTAG connection. The TCK rate can be set via the software. A lot of work is already taken off your hands using the large available library of FLASH components such as DDR2, SRAM, SDRAM, etc. as well as CPLDs and FPGAs – but of course we can also create individual library models for your projects.
Module integrations
We are happy to integrate existing modules for you.
Additional tools and options
DLL applications
The onTAP DLL is a GUI that loads an SVF file. When the application starts, the test runs fully automatically. The test results from the test file are then displayed in the test result window. In the event of an error, the associated diagnostic message is copied from the .FAIL file to the diagnostic message window. Test calls created are saved in the history_list.txt file – the same location where the ontap.dll file was saved. The test history can be selected at any time in the selection box next to the browser button. Each test can also be started using this selection field.
USB test and programming cable – a plug and play solution
The onTAP USB test and programming cable connects the onTAP programming environment to your device under test. It can replace existing Xilinx, Altera or customer-specific connections.
The TCK clock rate can be adjusted via the software. Input and output voltages are also checked and, if necessary, adjusted in the range of 1.5 to 5.0 volts using a reference voltage (VRef) or manually. Chaining can also be implemented using this cable.
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