by Flynn Systems | Jan 27, 2021 | onTAP JTAG Blog
Engineering has many different branches that students can expand into as they complete their college degrees and begin searching in the field for a position. Within the world of electric engineering is the smaller yet essential area of electronic engineering. This... 
by admin | Nov 1, 2020 | Boundary Scan Test, JTAG Boundary Scan, onTAP Usage
Mid-state or resistive shorts are a significant problem that often goes undetected by a typical boundary scan test. As a global industry leader, the professionals at Flynn Systems recognized this “hole” in boundary scan testing and quickly designed a... 
by Flynn Systems | Jun 12, 2017 | JTAG, JTAG Boundary Scan, onTAP, onTAP JTAG Blog
Once a board developer passes along the new board and all related files and procedures to a test developer, the boundary scan test process can begin. We recommend including the TAP Integrity Test at the beginning of your interconnect test because the TAP contains pins... by admin | Dec 16, 2009 | Boundary Scan, Boundary Scan Test, JTAG, JTAG Boundary Scan, onTAP JTAG Blog, onTAP Usage
As the boundary scan community continues looking for new ways to improve test procedures and achieve higher and higher fault coverage, we expect the test tools to compensate for shortcomings in silicon devices or board design. We are constantly exposed to new... by admin | Oct 30, 2009 | JTAG Boundary Scan, onTAP, onTAP JTAG Blog, onTAP Usage
Ontap_parallel.exe can be used to simultaneously run test suites on multiple PC boards using the onTAP DLL. Parallel board testing must be enabled for the DLL license. Testing is fastest on a multiple processor PC , particularly where one core processor is available...
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